BibTeX record conf/ats/HayesPB04

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@inproceedings{DBLP:conf/ats/HayesPB04,
  author       = {John P. Hayes and
                  Ilia Polian and
                  Bernd Becker},
  title        = {Testing for Missing-Gate Faults in Reversible Circuits},
  booktitle    = {13th Asian Test Symposium {(ATS} 2004), 15-17 November 2004, Kenting,
                  Taiwan},
  pages        = {100--105},
  publisher    = {{IEEE} Computer Society},
  year         = {2004},
  url          = {https://doi.org/10.1109/ATS.2004.84},
  doi          = {10.1109/ATS.2004.84},
  timestamp    = {Fri, 24 Mar 2023 00:02:34 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/HayesPB04.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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