BibTeX record conf/ats/KonijnenburgLG99

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@inproceedings{DBLP:conf/ats/KonijnenburgLG99,
  author       = {M. H. Konijnenburg and
                  Hans van der Linden and
                  Ad J. van de Goor},
  title        = {Fault (In)Dependent Cost Estimates and Conflict-Directed Backtracking
                  to Guide Sequential Circuit Test Generation},
  booktitle    = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai,
                  China},
  pages        = {185--191},
  publisher    = {{IEEE} Computer Society},
  year         = {1999},
  url          = {https://doi.org/10.1109/ATS.1999.810749},
  doi          = {10.1109/ATS.1999.810749},
  timestamp    = {Fri, 24 Mar 2023 00:02:34 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/KonijnenburgLG99.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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