BibTeX record conf/ats/MichinishiYOIF96

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@inproceedings{DBLP:conf/ats/MichinishiYOIF96,
  author       = {Hiroyuki Michinishi and
                  Tokumi Yokohira and
                  Takuji Okamoto and
                  Tomoo Inoue and
                  Hideo Fujiwara},
  title        = {A Test Methodology for Interconnect Structures of LUT-based FPGAs},
  booktitle    = {5th Asian Test Symposium {(ATS} '96), November 20-22, 1996, Hsinchu,
                  Taiwan},
  pages        = {68--74},
  publisher    = {{IEEE} Computer Society},
  year         = {1996},
  url          = {https://doi.org/10.1109/ATS.1996.555139},
  doi          = {10.1109/ATS.1996.555139},
  timestamp    = {Fri, 24 Mar 2023 00:02:34 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/MichinishiYOIF96.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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