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BibTeX record conf/ats/MillicanSRA19
@inproceedings{DBLP:conf/ats/MillicanSRA19, author = {Spencer K. Millican and Yang Sun and Soham Roy and Vishwani D. Agrawal}, title = {Applying Neural Networks to Delay Fault Testing: Test Point Insertion and Random Circuit Training}, booktitle = {28th {IEEE} Asian Test Symposium, {ATS} 2019, Kolkata, India, December 10-13, 2019}, pages = {13--18}, publisher = {{IEEE}}, year = {2019}, url = {https://doi.org/10.1109/ATS47505.2019.000-7}, doi = {10.1109/ATS47505.2019.000-7}, timestamp = {Tue, 14 Jan 2020 13:24:45 +0100}, biburl = {https://dblp.org/rec/conf/ats/MillicanSRA19.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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