BibTeX record conf/cicc/TanZTLLZL13

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@inproceedings{DBLP:conf/cicc/TanZTLLZL13,
  author       = {Christine P. Tan and
                  Congshu Zhou and
                  Yi Tian and
                  Chang Liu and
                  Hein{-}Mun Lam and
                  Jian Zhang and
                  Mark Lu},
  title        = {Design for manufacturing layout analyses correlate layout to physico-chemical
                  yield loss mechanisms},
  booktitle    = {Proceedings of the {IEEE} 2013 Custom Integrated Circuits Conference,
                  {CICC} 2013, San Jose, CA, USA, September 22-25, 2013},
  pages        = {1--4},
  publisher    = {{IEEE}},
  year         = {2013},
  url          = {https://doi.org/10.1109/CICC.2013.6658535},
  doi          = {10.1109/CICC.2013.6658535},
  timestamp    = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl       = {https://dblp.org/rec/conf/cicc/TanZTLLZL13.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}