BibTeX record conf/cicc/WangRKVKC07

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@inproceedings{DBLP:conf/cicc/WangRKVKC07,
  author       = {Wenping Wang and
                  Vijay Reddy and
                  Anand T. Krishnan and
                  Rakesh Vattikonda and
                  Srikanth Krishnan and
                  Yu Cao},
  title        = {An Integrated Modeling Paradigm of Circuit Reliability for 65nm {CMOS}
                  Technology},
  booktitle    = {Proceedings of the {IEEE} 2007 Custom Integrated Circuits Conference,
                  {CICC} 2007, DoubleTree Hotel, San Jose, California, USA, September
                  16-19, 2007},
  pages        = {511--514},
  publisher    = {{IEEE}},
  year         = {2007},
  url          = {https://doi.org/10.1109/CICC.2007.4405783},
  doi          = {10.1109/CICC.2007.4405783},
  timestamp    = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl       = {https://dblp.org/rec/conf/cicc/WangRKVKC07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}