BibTeX record conf/date/JenihhinHRKLSKH20

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@inproceedings{DBLP:conf/date/JenihhinHRKLSKH20,
  author       = {Maksim Jenihhin and
                  Said Hamdioui and
                  Matteo Sonza Reorda and
                  Milos Krstic and
                  Peter Langend{\"{o}}rfer and
                  Christian Sauer and
                  Anton Klotz and
                  Michael H{\"{u}}bner and
                  J{\"{o}}rg Nolte and
                  Heinrich Theodor Vierhaus and
                  Georgios N. Selimis and
                  Dan Alexandrescu and
                  Mottaqiallah Taouil and
                  Geert Jan Schrijen and
                  Jaan Raik and
                  Luca Sterpone and
                  Giovanni Squillero and
                  Zoya Dyka},
  title        = {{RESCUE:} Interdependent Challenges of Reliability, Security and Quality
                  in Nanoelectronic Systems},
  booktitle    = {2020 Design, Automation {\&} Test in Europe Conference {\&}
                  Exhibition, {DATE} 2020, Grenoble, France, March 9-13, 2020},
  pages        = {388--393},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.23919/DATE48585.2020.9116558},
  doi          = {10.23919/DATE48585.2020.9116558},
  timestamp    = {Mon, 05 Feb 2024 20:28:21 +0100},
  biburl       = {https://dblp.org/rec/conf/date/JenihhinHRKLSKH20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}