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BibTeX record conf/date/JutmanLLRJRKKE17
@inproceedings{DBLP:conf/date/JutmanLLRJRKKE17, author = {Artur Jutman and Christophe Lotz and Erik Larsson and Matteo Sonza Reorda and Maksim Jenihhin and Jaan Raik and Hans G. Kerkhoff and Rene Krenz{-}Baath and Piet Engelke}, editor = {David Atienza and Giorgio Di Natale}, title = {{BASTION:} Board and SoC test instrumentation for ageing and no failure found}, booktitle = {Design, Automation {\&} Test in Europe Conference {\&} Exhibition, {DATE} 2017, Lausanne, Switzerland, March 27-31, 2017}, pages = {115--120}, publisher = {{IEEE}}, year = {2017}, url = {https://doi.org/10.23919/DATE.2017.7926968}, doi = {10.23919/DATE.2017.7926968}, timestamp = {Sun, 25 Oct 2020 23:15:41 +0100}, biburl = {https://dblp.org/rec/conf/date/JutmanLLRJRKKE17.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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