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BibTeX record conf/date/Shamsi0PJ19
@inproceedings{DBLP:conf/date/Shamsi0PJ19, author = {Kaveh Shamsi and Meng Li and David Z. Pan and Yier Jin}, editor = {J{\"{u}}rgen Teich and Franco Fummi}, title = {{KC2:} Key-Condition Crunching for Fast Sequential Circuit Deobfuscation}, booktitle = {Design, Automation {\&} Test in Europe Conference {\&} Exhibition, {DATE} 2019, Florence, Italy, March 25-29, 2019}, pages = {534--539}, publisher = {{IEEE}}, year = {2019}, url = {https://doi.org/10.23919/DATE.2019.8715053}, doi = {10.23919/DATE.2019.8715053}, timestamp = {Sat, 09 Apr 2022 12:47:49 +0200}, biburl = {https://dblp.org/rec/conf/date/Shamsi0PJ19.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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