BibTeX record conf/ddecs/MukhopadhyayCR07

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@inproceedings{DBLP:conf/ddecs/MukhopadhyayCR07,
  author       = {Saibal Mukhopadhyay and
                  Qikai Chen and
                  Kaushik Roy},
  editor       = {Patrick Girard and
                  Andrzej Krasniewski and
                  Elena Gramatov{\'{a}} and
                  Adam Pawlak and
                  Tomasz Garbolino},
  title        = {Memories in Scaled Technologies: {A} Review of Process Induced Failures,
                  Test Methodologies, and Fault Tolerance},
  booktitle    = {Proceedings of the 10th {IEEE} Workshop on Design {\&} Diagnostics
                  of Electronic Circuits {\&} Systems {(DDECS} 2007), Krak{\'{o}}w,
                  Poland, April 11-13, 2007},
  pages        = {69--74},
  publisher    = {{IEEE} Computer Society},
  year         = {2007},
  url          = {https://doi.org/10.1109/DDECS.2007.4295256},
  doi          = {10.1109/DDECS.2007.4295256},
  timestamp    = {Fri, 24 Mar 2023 00:04:14 +0100},
  biburl       = {https://dblp.org/rec/conf/ddecs/MukhopadhyayCR07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}