BibTeX record conf/ddecs/OdabasiYABPD18

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@inproceedings{DBLP:conf/ddecs/OdabasiYABPD18,
  author       = {Izel Cagin Odabasi and
                  Mustafa Berke Yelten and
                  Engin Afacan and
                  I. Faik Baskaya and
                  Ali Emre Pusane and
                  G{\"{u}}nhan D{\"{u}}ndar},
  title        = {A Rare Event Based Yield Estimation Methodology for Analog Circuits},
  booktitle    = {21st {IEEE} International Symposium on Design and Diagnostics of Electronic
                  Circuits {\&} Systems, {DDECS} 2018, Budapest, Hungary, April
                  25-27, 2018},
  pages        = {33--38},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/DDECS.2018.00013},
  doi          = {10.1109/DDECS.2018.00013},
  timestamp    = {Sat, 19 Oct 2019 20:08:34 +0200},
  biburl       = {https://dblp.org/rec/conf/ddecs/OdabasiYABPD18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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