BibTeX record conf/ddecs/UbarKJR17

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@inproceedings{DBLP:conf/ddecs/UbarKJR17,
  author       = {Raimund Ubar and
                  Sergei Kostin and
                  Maksim Jenihhin and
                  Jaan Raik},
  editor       = {Manfred Dietrich and
                  Ondrej Nov{\'{a}}k},
  title        = {A scalable technique to identify true critical paths in sequential
                  circuits},
  booktitle    = {20th {IEEE} International Symposium on Design and Diagnostics of Electronic
                  Circuits {\&} Systems, {DDECS} 2017, Dresden, Germany, April 19-21,
                  2017},
  pages        = {152--157},
  publisher    = {{IEEE}},
  year         = {2017},
  url          = {https://doi.org/10.1109/DDECS.2017.7934568},
  doi          = {10.1109/DDECS.2017.7934568},
  timestamp    = {Sun, 25 Oct 2020 22:45:44 +0100},
  biburl       = {https://dblp.org/rec/conf/ddecs/UbarKJR17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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