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BibTeX record conf/ddecs/UbarKJR17
@inproceedings{DBLP:conf/ddecs/UbarKJR17, author = {Raimund Ubar and Sergei Kostin and Maksim Jenihhin and Jaan Raik}, editor = {Manfred Dietrich and Ondrej Nov{\'{a}}k}, title = {A scalable technique to identify true critical paths in sequential circuits}, booktitle = {20th {IEEE} International Symposium on Design and Diagnostics of Electronic Circuits {\&} Systems, {DDECS} 2017, Dresden, Germany, April 19-21, 2017}, pages = {152--157}, publisher = {{IEEE}}, year = {2017}, url = {https://doi.org/10.1109/DDECS.2017.7934568}, doi = {10.1109/DDECS.2017.7934568}, timestamp = {Sun, 25 Oct 2020 22:45:44 +0100}, biburl = {https://dblp.org/rec/conf/ddecs/UbarKJR17.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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