BibTeX record conf/dft/AllanW94

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@inproceedings{DBLP:conf/dft/AllanW94,
  author       = {Gerard A. Allan and
                  Anthony J. Walton},
  title        = {Efficient Critical Area Algorithms and Their Application to Yield
                  Improvement and Test Strategies},
  booktitle    = {The {IEEE} International Workshop on Defect and Fault Tolerance in
                  {VLSI} Systems, October 17-19, 1994, Montr{\'{e}}al, Quebec,
                  Canada, Proceedings},
  pages        = {88--96},
  publisher    = {{IEEE} Computer Society},
  year         = {1994},
  timestamp    = {Mon, 03 Feb 2003 15:42:59 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/AllanW94.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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