BibTeX record conf/dft/BubelMWNHSG95

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@inproceedings{DBLP:conf/dft/BubelMWNHSG95,
  author    = {Igor Bubel and
               Wojciech Maly and
               Thomas Waas and
               Pranab K. Nag and
               Hans Hartmann and
               Doris Schmitt{-}Landsiedel and
               Susanne Griep},
  title     = {{AFFCCA:} a tool for critical area analysis with circular defects
               and lithography deformed layout},
  booktitle = {1995 {IEEE} International Symposium on Defect and Fault Tolerance
               in {VLSI} and Nanotechnology Systems, {DFT} 1995, Lafayette, LA, USA,
               November 13-15, 1995},
  pages     = {10--18},
  year      = {1995},
  crossref  = {DBLP:conf/dft/1995},
  url       = {https://doi.org/10.1109/DFTVS.1995.476932},
  doi       = {10.1109/DFTVS.1995.476932},
  timestamp = {Wed, 17 May 2017 10:54:38 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/dft/BubelMWNHSG95},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/dft/1995,
  title     = {1995 {IEEE} International Symposium on Defect and Fault Tolerance
               in {VLSI} and Nanotechnology Systems, {DFT} 1995, Lafayette, LA, USA,
               November 13-15, 1995},
  publisher = {{IEEE} Computer Society},
  year      = {1995},
  url       = {http://www.computer.org/csdl/proceedings/dft/1995/7107/00/index.html},
  isbn      = {0-8186-7107-6},
  timestamp = {Mon, 10 Nov 2014 18:15:17 +0100},
  biburl    = {https://dblp.org/rec/bib/conf/dft/1995},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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