BibTeX record conf/dft/ChampeixBDRLS15

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@inproceedings{DBLP:conf/dft/ChampeixBDRLS15,
  author    = {Clement Champeix and
               Nicolas Borrel and
               Jean{-}Max Dutertre and
               Bruno Robisson and
               Mathieu Lisart and
               Alexandre Sarafianos},
  title     = {{SEU} sensitivity and modeling using pico-second pulsed laser stimulation
               of a {D} Flip-Flop in 40 nm {CMOS} technology},
  booktitle = {2015 {IEEE} International Symposium on Defect and Fault Tolerance
               in {VLSI} and Nanotechnology Systems, {DFTS} 2015, Amherst, MA, USA,
               October 12-14, 2015},
  pages     = {177--182},
  year      = {2015},
  crossref  = {DBLP:conf/dft/2015},
  url       = {https://doi.org/10.1109/DFT.2015.7315158},
  doi       = {10.1109/DFT.2015.7315158},
  timestamp = {Sat, 19 Oct 2019 20:14:36 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/dft/ChampeixBDRLS15},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/dft/2015,
  title     = {2015 {IEEE} International Symposium on Defect and Fault Tolerance
               in {VLSI} and Nanotechnology Systems, {DFTS} 2015, Amherst, MA, USA,
               October 12-14, 2015},
  publisher = {{IEEE} Computer Society},
  year      = {2015},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/7304347/proceeding},
  isbn      = {978-1-4799-8606-4},
  timestamp = {Wed, 16 Oct 2019 14:14:57 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/dft/2015},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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