BibTeX record conf/dft/ShafikYKM17

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@inproceedings{DBLP:conf/dft/ShafikYKM17,
  author       = {Rishad A. Shafik and
                  Qiaoyan Yu and
                  S. Saqib Khursheed and
                  Antonio Miele},
  title        = {Welcome Message},
  booktitle    = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
                  and Nanotechnology Systems, {DFT} 2017, Cambridge, United Kingdom,
                  October 23-25, 2017},
  publisher    = {{IEEE} Computer Society},
  year         = {2017},
  url          = {https://doi.org/10.1109/DFT.2017.8244425},
  doi          = {10.1109/DFT.2017.8244425},
  timestamp    = {Sat, 05 Sep 2020 18:00:36 +0200},
  biburl       = {https://dblp.org/rec/conf/dft/ShafikYKM17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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