BibTeX record conf/dsd/KuknerWRKCPLG12

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@inproceedings{DBLP:conf/dsd/KuknerWRKCPLG12,
  author    = {Halil Kukner and
               Pieter Weckx and
               Praveen Raghavan and
               Ben Kaczer and
               Francky Catthoor and
               Liesbet Van der Perre and
               Rudy Lauwereins and
               Guido Groeseneken},
  title     = {Impact of Duty Factor, Stress Stimuli, and Gate Drive Strength on
               Gate Delay Degradation with an Atomistic Trap-Based {BTI} Model},
  booktitle = {15th Euromicro Conference on Digital System Design, {DSD} 2012, Cesme,
               Izmir, Turkey, September 5-8, 2012},
  pages     = {1--7},
  year      = {2012},
  crossref  = {DBLP:conf/dsd/2012},
  url       = {https://doi.org/10.1109/DSD.2012.77},
  doi       = {10.1109/DSD.2012.77},
  timestamp = {Sat, 19 Oct 2019 20:02:13 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/dsd/KuknerWRKCPLG12},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/dsd/2012,
  title     = {15th Euromicro Conference on Digital System Design, {DSD} 2012, Cesme,
               Izmir, Turkey, September 5-8, 2012},
  publisher = {{IEEE} Computer Society},
  year      = {2012},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/6384916/proceeding},
  isbn      = {978-1-4673-2498-4},
  timestamp = {Wed, 16 Oct 2019 14:14:57 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/dsd/2012},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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