BibTeX record conf/essderc/KernerCCH12

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@inproceedings{DBLP:conf/essderc/KernerCCH12,
  author       = {Christoph Kerner and
                  Ivan Ciofi and
                  Thomas Chiarella and
                  Stefaan Van Huylenbroeck},
  title        = {Methodology for extracting the characteristic capacitances of a power
                  {MOSFET} transistor, using conventional on-wafer testing techniques},
  booktitle    = {Proceedings of the 2012 European Solid-State Device Research Conference,
                  {ESSDERC} 2012, Bordeaux, France, September 17-21, 2012},
  pages        = {221--225},
  publisher    = {{IEEE}},
  year         = {2012},
  url          = {https://doi.org/10.1109/ESSDERC.2012.6343373},
  doi          = {10.1109/ESSDERC.2012.6343373},
  timestamp    = {Wed, 16 Oct 2019 14:14:50 +0200},
  biburl       = {https://dblp.org/rec/conf/essderc/KernerCCH12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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