BibTeX record conf/essderc/ReggianiBGGPCTW12

download as .bib file

@inproceedings{DBLP:conf/essderc/ReggianiBGGPCTW12,
  author       = {Susanna Reggiani and
                  Gaetano Barone and
                  Elena Gnani and
                  Antonio Gnudi and
                  Stefano Poli and
                  Ming{-}Yeh Chuang and
                  Weidong Tian and
                  Rick Wise},
  title        = {{TCAD} degradation modeling for {LDMOS} transistors},
  booktitle    = {Proceedings of the 2012 European Solid-State Device Research Conference,
                  {ESSDERC} 2012, Bordeaux, France, September 17-21, 2012},
  pages        = {185--188},
  publisher    = {{IEEE}},
  year         = {2012},
  url          = {https://doi.org/10.1109/ESSDERC.2012.6343364},
  doi          = {10.1109/ESSDERC.2012.6343364},
  timestamp    = {Wed, 02 Nov 2022 08:13:16 +0100},
  biburl       = {https://dblp.org/rec/conf/essderc/ReggianiBGGPCTW12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.