BibTeX record conf/etfa/LiuL18

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@inproceedings{DBLP:conf/etfa/LiuL18,
  author       = {Yang Liu and
                  Xin Li},
  title        = {Predictive Modeling for Advanced Virtual Metrology: {A} Tree-Based
                  Approach},
  booktitle    = {23rd {IEEE} International Conference on Emerging Technologies and
                  Factory Automation, {ETFA} 2018, Torino, Italy, September 4-7, 2018},
  pages        = {845--852},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/ETFA.2018.8502480},
  doi          = {10.1109/ETFA.2018.8502480},
  timestamp    = {Thu, 13 Apr 2023 17:53:46 +0200},
  biburl       = {https://dblp.org/rec/conf/etfa/LiuL18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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