BibTeX record conf/ets/0001TD19

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@inproceedings{DBLP:conf/ets/0001TD19,
  author       = {Sebastian Huhn and
                  Daniel Tille and
                  Rolf Drechsler},
  title        = {Hybrid Architecture for Embedded Test Compression to Process Rejected
                  Test Patterns},
  booktitle    = {24th {IEEE} European Test Symposium, {ETS} 2019, Baden-Baden, Germany,
                  May 27-31, 2019},
  pages        = {1--2},
  publisher    = {{IEEE}},
  year         = {2019},
  url          = {https://doi.org/10.1109/ETS.2019.8791508},
  doi          = {10.1109/ETS.2019.8791508},
  timestamp    = {Fri, 27 Mar 2020 08:59:12 +0100},
  biburl       = {https://dblp.org/rec/conf/ets/0001TD19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}