BibTeX record conf/ets/AlvesSIDNB11

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@inproceedings{DBLP:conf/ets/AlvesSIDNB11,
  author    = {Nuno Alves and
               Yiwen Shi and
               Nicholas Imbriglia and
               Jennifer Dworak and
               Kundan Nepal and
               R. Iris Bahar},
  title     = {Dynamic Test Set Selection Using Implication-Based On-Chip Diagnosis},
  booktitle = {16th European Test Symposium, {ETS} 2011, Trondheim, Norway, May 23-27,
               2011},
  pages     = {211},
  year      = {2011},
  crossref  = {DBLP:conf/ets/2011},
  url       = {https://doi.org/10.1109/ETS.2011.59},
  doi       = {10.1109/ETS.2011.59},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/ets/AlvesSIDNB11},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/ets/2011,
  title     = {16th European Test Symposium, {ETS} 2011, Trondheim, Norway, May 23-27,
               2011},
  publisher = {{IEEE} Computer Society},
  year      = {2011},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/5955410/proceeding},
  isbn      = {978-0-7695-4433-5},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/ets/2011},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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