BibTeX record conf/ets/PatelWS18

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@inproceedings{DBLP:conf/ets/PatelWS18,
  author       = {Dhruv Patel and
                  Derek Wright and
                  Manoj Sachdev},
  title        = {Sense amplifier offset characterisation and test implications for
                  low-voltage SRAMs in 65 nm},
  booktitle    = {23rd {IEEE} European Test Symposium, {ETS} 2018, Bremen, Germany,
                  May 28 - June 1, 2018},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/ETS.2018.8400696},
  doi          = {10.1109/ETS.2018.8400696},
  timestamp    = {Thu, 22 Sep 2022 14:05:51 +0200},
  biburl       = {https://dblp.org/rec/conf/ets/PatelWS18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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