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BibTeX record conf/ets/SfikasTTH15
@inproceedings{DBLP:conf/ets/SfikasTTH15, author = {Yiorgos Sfikas and Yiorgos Tsiatouhas and Mottaqiallah Taouil and Said Hamdioui}, title = {On resistive open defect detection in DRAMs: The charge accumulation effect}, booktitle = {20th {IEEE} European Test Symposium, {ETS} 2015, Cluj-Napoca, Romania, 25-29 May, 2015}, pages = {1--6}, publisher = {{IEEE}}, year = {2015}, url = {https://doi.org/10.1109/ETS.2015.7138747}, doi = {10.1109/ETS.2015.7138747}, timestamp = {Wed, 16 Oct 2019 14:14:53 +0200}, biburl = {https://dblp.org/rec/conf/ets/SfikasTTH15.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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