BibTeX record conf/ets/TaouilH11

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@inproceedings{DBLP:conf/ets/TaouilH11,
  author       = {Mottaqiallah Taouil and
                  Said Hamdioui},
  title        = {Layer Redundancy Based Yield Improvement for 3D Wafer-to-Wafer Stacked
                  Memories},
  booktitle    = {16th European Test Symposium, {ETS} 2011, Trondheim, Norway, May 23-27,
                  2011},
  pages        = {45--50},
  publisher    = {{IEEE} Computer Society},
  year         = {2011},
  url          = {https://doi.org/10.1109/ETS.2011.55},
  doi          = {10.1109/ETS.2011.55},
  timestamp    = {Thu, 23 Mar 2023 23:58:22 +0100},
  biburl       = {https://dblp.org/rec/conf/ets/TaouilH11.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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