BibTeX record conf/ets/XuWY06

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@inproceedings{DBLP:conf/ets/XuWY06,
  author       = {Qiang Xu and
                  Baosheng Wang and
                  F. Y. Young},
  title        = {Retention-Aware Test Scheduling for BISTed Embedded SRAMs},
  booktitle    = {11th European Test Symposium, {ETS} 2006, Southhampton, UK, May 21-24,
                  2006},
  pages        = {83--88},
  publisher    = {{IEEE} Computer Society},
  year         = {2006},
  url          = {https://doi.org/10.1109/ETS.2006.40},
  doi          = {10.1109/ETS.2006.40},
  timestamp    = {Thu, 30 Mar 2023 18:37:51 +0200},
  biburl       = {https://dblp.org/rec/conf/ets/XuWY06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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