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BibTeX record conf/ets/XuWY06
@inproceedings{DBLP:conf/ets/XuWY06, author = {Qiang Xu and Baosheng Wang and F. Y. Young}, title = {Retention-Aware Test Scheduling for BISTed Embedded SRAMs}, booktitle = {11th European Test Symposium, {ETS} 2006, Southhampton, UK, May 21-24, 2006}, pages = {83--88}, publisher = {{IEEE} Computer Society}, year = {2006}, url = {https://doi.org/10.1109/ETS.2006.40}, doi = {10.1109/ETS.2006.40}, timestamp = {Thu, 30 Mar 2023 18:37:51 +0200}, biburl = {https://dblp.org/rec/conf/ets/XuWY06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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