BibTeX record conf/ets/YonedaNISF11

download as .bib file

@inproceedings{DBLP:conf/ets/YonedaNISF11,
  author       = {Tomokazu Yoneda and
                  Makoto Nakao and
                  Michiko Inoue and
                  Yasuo Sato and
                  Hideo Fujiwara},
  title        = {Temperature-Variation-Aware Test Pattern Optimization},
  booktitle    = {16th European Test Symposium, {ETS} 2011, Trondheim, Norway, May 23-27,
                  2011},
  pages        = {214},
  publisher    = {{IEEE} Computer Society},
  year         = {2011},
  url          = {https://doi.org/10.1109/ETS.2011.45},
  doi          = {10.1109/ETS.2011.45},
  timestamp    = {Thu, 23 Mar 2023 23:58:23 +0100},
  biburl       = {https://dblp.org/rec/conf/ets/YonedaNISF11.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.