BibTeX record conf/ewdts/MelikyanHH10

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@inproceedings{DBLP:conf/ewdts/MelikyanHH10,
  author       = {Vazgen Melikyan and
                  Aristakes Hovsepyan and
                  Tigran Harutyunyan},
  title        = {Schematic protection method from influence of total ionization dose
                  effects on threshold voltage of {MOS} transistors},
  booktitle    = {2010 East-West Design {\&} Test Symposium, {EWDTS} 2010, St. Petersburg,
                  Russia, September 17-20, 2010},
  pages        = {407--409},
  publisher    = {{IEEE} Computer Society},
  year         = {2010},
  url          = {https://doi.org/10.1109/EWDTS.2010.5742096},
  doi          = {10.1109/EWDTS.2010.5742096},
  timestamp    = {Thu, 23 Mar 2023 23:58:25 +0100},
  biburl       = {https://dblp.org/rec/conf/ewdts/MelikyanHH10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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