BibTeX record conf/ftcs/SinghK92

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@inproceedings{DBLP:conf/ftcs/SinghK92,
  author       = {Adit D. Singh and
                  C. Mani Krishna},
  title        = {Chip Test Optimization Using Defect Clustering Information},
  booktitle    = {Digest of Papers: FTCS-22, The Twenty-Second Annual International
                  Symposium on Fault-Tolerant Computing, Boston, Massachusetts, USA,
                  July 8-10, 1992},
  pages        = {366--373},
  publisher    = {{IEEE} Computer Society},
  year         = {1992},
  url          = {https://doi.org/10.1109/FTCS.1992.243564},
  doi          = {10.1109/FTCS.1992.243564},
  timestamp    = {Sat, 10 Sep 2022 20:48:50 +0200},
  biburl       = {https://dblp.org/rec/conf/ftcs/SinghK92.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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