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BibTeX record conf/ftcs/SinghK92
@inproceedings{DBLP:conf/ftcs/SinghK92, author = {Adit D. Singh and C. Mani Krishna}, title = {Chip Test Optimization Using Defect Clustering Information}, booktitle = {Digest of Papers: FTCS-22, The Twenty-Second Annual International Symposium on Fault-Tolerant Computing, Boston, Massachusetts, USA, July 8-10, 1992}, pages = {366--373}, publisher = {{IEEE} Computer Society}, year = {1992}, url = {https://doi.org/10.1109/FTCS.1992.243564}, doi = {10.1109/FTCS.1992.243564}, timestamp = {Sat, 10 Sep 2022 20:48:50 +0200}, biburl = {https://dblp.org/rec/conf/ftcs/SinghK92.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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