BibTeX record conf/icaisc/NaO04

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@inproceedings{DBLP:conf/icaisc/NaO04,
  author       = {Jae Hyung Na and
                  Hae{-}Seok Oh},
  editor       = {Leszek Rutkowski and
                  J{\"{o}}rg H. Siekmann and
                  Ryszard Tadeusiewicz and
                  Lotfi A. Zadeh},
  title        = {Wafer Die Position Detection Using Hierarchical Gray Level Corner
                  Detector},
  booktitle    = {Artificial Intelligence and Soft Computing - {ICAISC} 2004, 7th International
                  Conference, Zakopane, Poland, June 7-11, 2004, Proceedings},
  series       = {Lecture Notes in Computer Science},
  volume       = {3070},
  pages        = {748--753},
  publisher    = {Springer},
  year         = {2004},
  url          = {https://doi.org/10.1007/978-3-540-24844-6\_115},
  doi          = {10.1007/978-3-540-24844-6\_115},
  timestamp    = {Tue, 14 May 2019 10:00:55 +0200},
  biburl       = {https://dblp.org/rec/conf/icaisc/NaO04.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}