BibTeX record conf/iccad/ShimCS15

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@inproceedings{DBLP:conf/iccad/ShimCS15,
  author       = {Seongbo Shim and
                  Woohyun Chung and
                  Youngsoo Shin},
  editor       = {Diana Marculescu and
                  Frank Liu},
  title        = {Defect Probability of Directed Self-Assembly Lithography: Fast Identification
                  and Post-Placement Optimization},
  booktitle    = {Proceedings of the {IEEE/ACM} International Conference on Computer-Aided
                  Design, {ICCAD} 2015, Austin, TX, USA, November 2-6, 2015},
  pages        = {404--409},
  publisher    = {{IEEE}},
  year         = {2015},
  url          = {https://doi.org/10.1109/ICCAD.2015.7372598},
  doi          = {10.1109/ICCAD.2015.7372598},
  timestamp    = {Mon, 26 Jun 2023 16:43:56 +0200},
  biburl       = {https://dblp.org/rec/conf/iccad/ShimCS15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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