BibTeX record conf/iccd/MarchokM96

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@inproceedings{DBLP:conf/iccd/MarchokM96,
  author    = {Thomas E. Marchok and
               Wojciech Maly},
  title     = {Modeling the Difficulty of Sequential Automatic Test Pattern Generation},
  booktitle = {1996 International Conference on Computer Design {(ICCD} '96), {VLSI}
               in Computers and Processors, October 7-9, 1996, Austin, TX, USA, Proceedings},
  pages     = {261--271},
  year      = {1996},
  crossref  = {DBLP:conf/iccd/1996},
  url       = {https://doi.org/10.1109/ICCD.1996.563566},
  doi       = {10.1109/ICCD.1996.563566},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/iccd/MarchokM96},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/iccd/1996,
  title     = {1996 International Conference on Computer Design {(ICCD} '96), {VLSI}
               in Computers and Processors, October 7-9, 1996, Austin, TX, USA, Proceedings},
  publisher = {{IEEE} Computer Society},
  year      = {1996},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/4128/proceeding},
  isbn      = {0-8186-7554-3},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/iccd/1996},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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