BibTeX record conf/icecsys/SunJRSNDMB19

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@inproceedings{DBLP:conf/icecsys/SunJRSNDMB19,
  author       = {Yi Sun and
                  Hui Jiang and
                  Lakshmi Ramakrishnan and
                  Matan Segal and
                  Kundan Nepal and
                  Jennifer Dworak and
                  Theodore W. Manikas and
                  R. Iris Bahar},
  title        = {Test Architecture for Fine Grained Capture Power Reduction},
  booktitle    = {26th {IEEE} International Conference on Electronics, Circuits and
                  Systems, {ICECS} 2019, Genoa, Italy, November 27-29, 2019},
  pages        = {558--561},
  publisher    = {{IEEE}},
  year         = {2019},
  url          = {https://doi.org/10.1109/ICECS46596.2019.8964790},
  doi          = {10.1109/ICECS46596.2019.8964790},
  timestamp    = {Thu, 14 Oct 2021 10:15:52 +0200},
  biburl       = {https://dblp.org/rec/conf/icecsys/SunJRSNDMB19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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