BibTeX record conf/icst/KuhnKL17

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@inproceedings{DBLP:conf/icst/KuhnKL17,
  author       = {D. Richard Kuhn and
                  Raghu N. Kacker and
                  Yu Lei},
  title        = {A Model for T-Way Fault Profile Evolution during Testing},
  booktitle    = {2017 {IEEE} International Conference on Software Testing, Verification
                  and Validation Workshops, {ICST} Workshops 2017, Tokyo, Japan, March
                  13-17, 2017},
  pages        = {162--170},
  publisher    = {{IEEE} Computer Society},
  year         = {2017},
  url          = {https://doi.org/10.1109/ICSTW.2017.35},
  doi          = {10.1109/ICSTW.2017.35},
  timestamp    = {Thu, 11 Feb 2021 14:49:16 +0100},
  biburl       = {https://dblp.org/rec/conf/icst/KuhnKL17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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