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BibTeX record conf/idt/KhanTHKRC13
@inproceedings{DBLP:conf/idt/KhanTHKRC13, author = {Seyab Khan and Mottaqiallah Taouil and Said Hamdioui and Halil Kukner and Praveen Raghavan and Francky Catthoor}, title = {Impact of partial resistive defects and Bias Temperature Instability on {SRAM} decoder reliablity}, booktitle = {8th International Design and Test Symposium, {IDT} 2013, Marrakesh, Morocco, 16-18 December, 2013}, pages = {1--6}, publisher = {{IEEE}}, year = {2013}, url = {https://doi.org/10.1109/IDT.2013.6727124}, doi = {10.1109/IDT.2013.6727124}, timestamp = {Wed, 16 Oct 2019 14:14:49 +0200}, biburl = {https://dblp.org/rec/conf/idt/KhanTHKRC13.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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