BibTeX record conf/ifip5-7/ChienLT18

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@inproceedings{DBLP:conf/ifip5-7/ChienLT18,
  author       = {Chen{-}Fu Chien and
                  Yun{-}Siang Lin and
                  Yu{-}Shin Tan},
  editor       = {Ilkyeong Moon and
                  Gyu M. Lee and
                  Jinwoo Park and
                  Dimitris Kiritsis and
                  Gregor von Cieminski},
  title        = {Constructing a Metrology Sampling Framework for In-line Inspection
                  in Semiconductor Fabrication},
  booktitle    = {Advances in Production Management Systems. Smart Manufacturing for
                  Industry 4.0 - {IFIP} {WG} 5.7 International Conference, {APMS} 2018,
                  Seoul, Korea, August 26-30, 2018, Proceedings, Part {II}},
  series       = {{IFIP} Advances in Information and Communication Technology},
  volume       = {536},
  pages        = {73--80},
  publisher    = {Springer},
  year         = {2018},
  url          = {https://doi.org/10.1007/978-3-319-99707-0\_10},
  doi          = {10.1007/978-3-319-99707-0\_10},
  timestamp    = {Thu, 17 Oct 2019 08:41:39 +0200},
  biburl       = {https://dblp.org/rec/conf/ifip5-7/ChienLT18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}