BibTeX record conf/irps/0006GPTHA20

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@inproceedings{DBLP:conf/irps/0006GPTHA20,
  author       = {Kai Ni and
                  Aniket Gupta and
                  Om Prakash and
                  Simon Thomann and
                  Xiaobo Sharon Hu and
                  Hussam Amrouch},
  title        = {Impact of Extrinsic Variation Sources on the Device-to-Device Variation
                  in Ferroelectric {FET}},
  booktitle    = {2020 {IEEE} International Reliability Physics Symposium, {IRPS} 2020,
                  Dallas, TX, USA, April 28 - May 30, 2020},
  pages        = {1--5},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/IRPS45951.2020.9128323},
  doi          = {10.1109/IRPS45951.2020.9128323},
  timestamp    = {Fri, 24 Dec 2021 10:43:48 +0100},
  biburl       = {https://dblp.org/rec/conf/irps/0006GPTHA20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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