BibTeX record conf/irps/HuangMKYSWBK19

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@inproceedings{DBLP:conf/irps/HuangMKYSWBK19,
  author       = {H. Huang and
                  P. S. McLaughin and
                  James J. Kelly and
                  C.{-}C. Yang and
                  Richard G. Southwick and
                  M. Wang and
                  Griselda Bonilla and
                  Gauri Karve},
  title        = {Time Dependent Dielectric Breakdown of Cobalt and Ruthenium Interconnects
                  at 36nm Pitch},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2019, Monterey,
                  CA, USA, March 31 - April 4, 2019},
  pages        = {1--5},
  publisher    = {{IEEE}},
  year         = {2019},
  url          = {https://doi.org/10.1109/IRPS.2019.8720528},
  doi          = {10.1109/IRPS.2019.8720528},
  timestamp    = {Fri, 08 Sep 2023 15:28:18 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/HuangMKYSWBK19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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