BibTeX record conf/irps/JiGLJUKSLPJHLLH20

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@inproceedings{DBLP:conf/irps/JiGLJUKSLPJHLLH20,
  author       = {Yongsung Ji and
                  Hyunjae Goo and
                  Jungman Lim and
                  Tae{-}Young Jeong and
                  Taiki Uemura and
                  Gun Rae Kim and
                  Boil Seo and
                  Seungbae Lee and
                  Goeun Park and
                  Jeongmin Jo and
                  Sang{-}Il Han and
                  Kilho Lee and
                  Junghyuk Lee and
                  Sohee Hwang and
                  Daesop Lee and
                  Suksoo Pyo and
                  Hyun Taek Jung and
                  Shinhee Han and
                  Seungmo Noh and
                  Kiseok Suh and
                  Sungyoung Yoon and
                  Hyeonwoo Nam and
                  Hyewon Hwang and
                  Hai Jiang and
                  J. W. Kim and
                  D. Kwon and
                  Yoonjong Song and
                  K. H. Koh and
                  Hwasung Rhee and
                  Sangwoo Pae and
                  E. Lee},
  title        = {Reliability of Industrial grade Embedded-STT-MRAM},
  booktitle    = {2020 {IEEE} International Reliability Physics Symposium, {IRPS} 2020,
                  Dallas, TX, USA, April 28 - May 30, 2020},
  pages        = {1--3},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/IRPS45951.2020.9129178},
  doi          = {10.1109/IRPS45951.2020.9129178},
  timestamp    = {Fri, 12 Jan 2024 08:47:28 +0100},
  biburl       = {https://dblp.org/rec/conf/irps/JiGLJUKSLPJHLLH20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}