BibTeX record conf/irps/JiLBHCAZMIFKZGZ15

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@inproceedings{DBLP:conf/irps/JiLBHCAZMIFKZGZ15,
  author       = {Zhigang Ji and
                  Dimitri Linten and
                  Roman Boschke and
                  Geert Hellings and
                  S. H. Chen and
                  AliReza Alian and
                  D. Zhou and
                  Yves Mols and
                  Tsvetan Ivanov and
                  Jacopo Franco and
                  Ben Kaczer and
                  X. Zhang and
                  R. Gao and
                  Jianfu Zhang and
                  Weidong Zhang and
                  Nadine Collaert and
                  Guido Groeseneken},
  title        = {{ESD} characterization of planar InGaAs devices},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2015, Monterey,
                  CA, USA, April 19-23, 2015},
  pages        = {3},
  publisher    = {{IEEE}},
  year         = {2015},
  url          = {https://doi.org/10.1109/IRPS.2015.7112719},
  doi          = {10.1109/IRPS.2015.7112719},
  timestamp    = {Mon, 07 Aug 2023 15:56:18 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/JiLBHCAZMIFKZGZ15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}