BibTeX record conf/irps/LeeKSKS19

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@inproceedings{DBLP:conf/irps/LeeKSKS19,
  author       = {Nam{-}Hyun Lee and
                  Jongkyun Kim and
                  Donghee Son and
                  Kangjun Kim and
                  Jung Eun Seok},
  title        = {Comprehensive Study for OFF-State Hot Carrier Degrdation of Scaled
                  nMOSFETs in {DRAM}},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2019, Monterey,
                  CA, USA, March 31 - April 4, 2019},
  pages        = {1--4},
  publisher    = {{IEEE}},
  year         = {2019},
  url          = {https://doi.org/10.1109/IRPS.2019.8720444},
  doi          = {10.1109/IRPS.2019.8720444},
  timestamp    = {Wed, 16 Oct 2019 14:14:55 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/LeeKSKS19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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