BibTeX record conf/irps/LiuSKCLKKJJKHPP15

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@inproceedings{DBLP:conf/irps/LiuSKCLKKJJKHPP15,
  author       = {Changze Liu and
                  Hyun{-}Chul Sagong and
                  Hyejin Kim and
                  Seungjin Choo and
                  Hyunwoo Lee and
                  Yoohwan Kim and
                  Hyunjin Kim and
                  Bisung Jo and
                  Minjung Jin and
                  Jinjoo Kim and
                  Sangsu Ha and
                  Sangwoo Pae and
                  Jongwoo Park},
  title        = {Systematical study of 14nm FinFET reliability: From device level stress
                  to product {HTOL}},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2015, Monterey,
                  CA, USA, April 19-23, 2015},
  pages        = {2},
  publisher    = {{IEEE}},
  year         = {2015},
  url          = {https://doi.org/10.1109/IRPS.2015.7112693},
  doi          = {10.1109/IRPS.2015.7112693},
  timestamp    = {Mon, 04 Mar 2024 14:32:59 +0100},
  biburl       = {https://dblp.org/rec/conf/irps/LiuSKCLKKJJKHPP15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}