BibTeX record conf/irps/NajmS19

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@inproceedings{DBLP:conf/irps/NajmS19,
  author       = {Farid N. Najm and
                  Valeriy Sukharev},
  title        = {Efficient Simulation of Electromigration Damage in Large Chip Power
                  Grids Using Accurate Physical Models (Invited Paper)},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2019, Monterey,
                  CA, USA, March 31 - April 4, 2019},
  pages        = {1--10},
  publisher    = {{IEEE}},
  year         = {2019},
  url          = {https://doi.org/10.1109/IRPS.2019.8720438},
  doi          = {10.1109/IRPS.2019.8720438},
  timestamp    = {Wed, 16 Oct 2019 14:14:55 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/NajmS19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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