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BibTeX record conf/irps/ZhuHCZYZZMH18
@inproceedings{DBLP:conf/irps/ZhuHCZYZZMH18, author = {Jiejie Zhu and Bin Hou and Lixiang Chen and Qing Zhu and Ling Yang and Xiaowei Zhou and Peng Zhang and Xiaohua Ma and Yue Hao}, title = {Threshold voltage shift and interface/border trapping mechanism in Al2O3/AlGaN/GaN MOS-HEMTs}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame, CA, USA, March 11-15, 2018}, pages = {1}, publisher = {{IEEE}}, year = {2018}, url = {https://doi.org/10.1109/IRPS.2018.8353704}, doi = {10.1109/IRPS.2018.8353704}, timestamp = {Fri, 14 Jun 2024 12:35:01 +0200}, biburl = {https://dblp.org/rec/conf/irps/ZhuHCZYZZMH18.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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