BibTeX record conf/islped/KanjJN10

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@inproceedings{DBLP:conf/islped/KanjJN10,
  author       = {Rouwaida Kanj and
                  Rajiv V. Joshi and
                  Sani R. Nassif},
  editor       = {Vojin G. Oklobdzija and
                  Barry Pangle and
                  Naehyuck Chang and
                  Naresh R. Shanbhag and
                  Chris H. Kim},
  title        = {Statistical leakage modeling for accurate yield analysis: the {CDF}
                  matching method and its alternatives},
  booktitle    = {Proceedings of the 2010 International Symposium on Low Power Electronics
                  and Design, 2010, Austin, Texas, USA, August 18-20, 2010},
  pages        = {337--342},
  publisher    = {{ACM}},
  year         = {2010},
  url          = {https://doi.org/10.1145/1840845.1840915},
  doi          = {10.1145/1840845.1840915},
  timestamp    = {Tue, 06 Nov 2018 16:59:20 +0100},
  biburl       = {https://dblp.org/rec/conf/islped/KanjJN10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}