BibTeX record conf/isqed/ChangZWYB12

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@inproceedings{DBLP:conf/isqed/ChangZWYB12,
  author       = {Albert H. Chang and
                  Kewei Zuo and
                  Jean Wang and
                  Douglas Yu and
                  Duane S. Boning},
  editor       = {Keith A. Bowman and
                  Kamesh V. Gadepally and
                  Pallab Chatterjee and
                  Mark M. Budnik and
                  Lalitha Immaneni},
  title        = {Test structure, circuits and extraction methods to determine the radius
                  of infuence of {STI} and polysilicon pattern density},
  booktitle    = {Thirteenth International Symposium on Quality Electronic Design, {ISQED}
                  2012, Santa Clara, CA, USA, March 19-21, 2012},
  pages        = {185--192},
  publisher    = {{IEEE}},
  year         = {2012},
  url          = {https://doi.org/10.1109/ISQED.2012.6187493},
  doi          = {10.1109/ISQED.2012.6187493},
  timestamp    = {Wed, 16 Oct 2019 14:14:55 +0200},
  biburl       = {https://dblp.org/rec/conf/isqed/ChangZWYB12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}