BibTeX record conf/isqed/KurokawaYOKIM05

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@inproceedings{DBLP:conf/isqed/KurokawaYOKIM05,
  author    = {Atsushi Kurokawa and
               Masaharu Yamamoto and
               Nobuto Ono and
               Tetsuro Kage and
               Yasuaki Inoue and
               Hiroo Masuda},
  title     = {Capacitance and Yield Evaluations Using a 90-nm Process Technology
               Based on the Dense Power-Ground Interconnect Architecture},
  booktitle = {6th International Symposium on Quality of Electronic Design {(ISQED}
               2005), 21-23 March 2005, San Jose, CA, {USA}},
  pages     = {153--158},
  publisher = {{IEEE} Computer Society},
  year      = {2005},
  url       = {https://doi.org/10.1109/ISQED.2005.29},
  doi       = {10.1109/ISQED.2005.29},
  timestamp = {Wed, 16 Oct 2019 14:14:55 +0200},
  biburl    = {https://dblp.org/rec/conf/isqed/KurokawaYOKIM05.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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