BibTeX record conf/isqed/KuzmiczPRU01

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@inproceedings{DBLP:conf/isqed/KuzmiczPRU01,
  author    = {Wieslaw Kuzmicz and
               Witold A. Pleskacz and
               Jaan Raik and
               Raimund Ubar},
  title     = {Defect-Oriented Fault Simulation and Test Generation in Digital Circuits},
  booktitle = {2nd International Symposium on Quality of Electronic Design {(ISQED}
               2001), 26-28 March 2001, San Jose, CA, {USA}},
  pages     = {365--371},
  year      = {2001},
  crossref  = {DBLP:conf/isqed/2001},
  url       = {https://doi.org/10.1109/ISQED.2001.915257},
  doi       = {10.1109/ISQED.2001.915257},
  timestamp = {Sat, 19 Oct 2019 20:17:55 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/isqed/KuzmiczPRU01},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/isqed/2001,
  title     = {2nd International Symposium on Quality of Electronic Design {(ISQED}
               2001), 26-28 March 2001, San Jose, CA, {USA}},
  publisher = {{IEEE} Computer Society},
  year      = {2001},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/7308/proceeding},
  isbn      = {0-7695-1025-6},
  timestamp = {Wed, 16 Oct 2019 14:14:55 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/isqed/2001},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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