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BibTeX record conf/isqed/LeeKBS03
@inproceedings{DBLP:conf/isqed/LeeKBS03, author = {Dongwoo Lee and Wesley Kwong and David T. Blaauw and Dennis Sylvester}, title = {Simultaneous Subthreshold and Gate-Oxide Tunneling Leakage Current Analysis in Nanometer {CMOS} Design}, booktitle = {4th International Symposium on Quality of Electronic Design {(ISQED} 2003), 24-26 March 2003, San Jose, CA, {USA}}, pages = {287--292}, publisher = {{IEEE} Computer Society}, year = {2003}, url = {https://doi.org/10.1109/ISQED.2003.1194747}, doi = {10.1109/ISQED.2003.1194747}, timestamp = {Thu, 23 Mar 2023 23:58:32 +0100}, biburl = {https://dblp.org/rec/conf/isqed/LeeKBS03.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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