BibTeX record conf/isqed/LoLB17

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@inproceedings{DBLP:conf/isqed/LoLB17,
  author    = {Sam C. Lo and
               Taylor T. Lee and
               Aaron J. Barker},
  title     = {High sigma statistical hold time analysis in FinFET sequential circuits},
  booktitle = {18th International Symposium on Quality Electronic Design, {ISQED}
               2017, Santa Clara, CA, USA, March 14-15, 2017},
  pages     = {215--220},
  year      = {2017},
  crossref  = {DBLP:conf/isqed/2017},
  url       = {https://doi.org/10.1109/ISQED.2017.7918319},
  doi       = {10.1109/ISQED.2017.7918319},
  timestamp = {Thu, 11 May 2017 14:18:07 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/isqed/LoLB17},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/isqed/2017,
  title     = {18th International Symposium on Quality Electronic Design, {ISQED}
               2017, Santa Clara, CA, USA, March 14-15, 2017},
  publisher = {{IEEE}},
  year      = {2017},
  url       = {http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=7910185},
  isbn      = {978-1-5090-5404-6},
  timestamp = {Thu, 11 May 2017 14:17:41 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/isqed/2017},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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